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Author: david.le-bolloch

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Shear of a charge density wave observed by an XFEL source

The transport of charges through materials is an essential phenomenon for many devices, whether they are semiconductors, superconductors or batteries. Unfortunately, it is not possible to observe the motion of …

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Tracking Defects of Electronic Crystals by Coherent X-ray Diffraction

In this article, we review different experiments using advanced X-ray diffraction techniques, in particular coherent diffraction, which have enabled us to reveal the behavior of systems with broken symmetry such …

  • PhD opportunities
  • Shear of a charge density wave observed by an XFEL source
  • Generation and coexistence of CDW phases under biaxial elongation
  • Tracking Defects of Electronic Crystals by Coherent X-ray Diffraction
  • Spin- and angle-resolved inverse photoemission setup

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